Products

(click images for more information)

 
Electroluminescence Camera Systems

 

Electroluminescence camera systems are available for imaging cracked cells and other defects in still images or video. Solutions are available for the lab from small R&D cells to full modules, and travels systems are available for outdoor testing.  Systems come with a modified DSLR camera, filters, lens, tripod or stand, laptop or tablet computer,  power supply, MC4 cables to place between power supply and solar panel, and instructions for use and image enhancement.  

 

 

 
UV Fluorescence Systems

 

UVF is a fast method to detect cell cracks in aged modules.  We offer a low-cost handheld flashlight kit for detection by eye, and a high-throughput camera flash based system with throughputs up to 1000 modules/hour.

 

 

CellSpot-PL

 

Photoluminescence Wafer and Cell Tester

Safe red LED lightsource and high resolution PL camera within a lightproof enclosure to obtain contactless images of wafers and cells.  Can be configured to look at a single cell within a module.

 

 

 

 

 

 

 

 
LoadSpot

 

The LoadSpot performs static and cyclic (dynamic) load tests for standard IEC certification testing.  The bending tests are performed by applying vacuum or air-pressure to the rear side of the module, thus leaving the front side open for EL and IV testing.  For standard panels, applying a light vacuum to the rear side allows for a quick crack-opening test to predict future degradation were the closed cracks to become fully open in the field.

 

More info

MobileTestSpot

 

IV & EL Testing of solar panels in the field in a trailer-based mobile testing lab.  Quality control for new installations and more.

 

More info

 

 

ContactSpot

 

Fast measurement of contact resistivity for solar cell grid structures.  More accurate and lower variability than using manual probing.  Also measures line resistivity.

 

More info

 

 

ContactSpot-PRO

 

Nondestructive contact resistance measurements. 

Measure resistance between metallization and the silicon wafer
Hide test patterns within busbars (no cosmetic or efficiency effects)
Automatic alignment of probehead to test patterns
Standalone or in-line applications
Test every cell on a production line (<3 sec takt time)
Adaptable to in-line or rotary table automation

 

 

 

 

 

Print Print | Sitemap
© Bright Spot Automation LLC